Wafer Metrology Development Engineer

Provide technical leadership and hands-on metrology support for magnetic recording wafer process development, with a focus on overlay, AFM, and CDSEM measurements for critical dimension (CD), profile, and topography characterization.

Partner closely with magnetic recording head process R&D engineers to define, develop, and deploy advanced metrology solutions, including new measurement methodologies and algorithms. Lead metrology strategy for development programs while ensuring robust day-to-day measurement execution across multiple projects.

Serve as a core technical contributor within the R&D metrology organization, driving best practices and knowledge transfer while working in close alignment with the manufacturing metrology team to ensure consistency from development through production.